Abstract
Three-dimensional microstructure characterization of Ag3Sn intermetallics in Sn-rich solder was investigated. The 3D microstructure of near-eutectic Sn-3.5Ag solder was modeled by computer-aided reconstruction of micrographs. The serial sectioning process enabled the reconstruction, visualization, and measurement of the size and aspect ratio of the solder. A comparison of size and aspect ratio from 2D and 3D measurements shows that measurements in 3D are much more accurate.
Original language | English (US) |
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Pages (from-to) | 225-230 |
Number of pages | 6 |
Journal | Materials Characterization |
Volume | 52 |
Issue number | 3 |
DOIs | |
State | Published - Jun 2004 |
ASJC Scopus subject areas
- Materials Science(all)
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering