TY - JOUR
T1 - Theory and measurements of room temperature transport in graphene using Si O2 backgate and electrochemical gate
AU - Shishir, R. S.
AU - Chen, F.
AU - Xia, J.
AU - Tao, Nongjian
AU - Ferry, D. K.
N1 - Funding Information:
This work was supported in part by DOE (DE-FG03-01ER45943, J.X., F.C., and N.J.T.).
PY - 2009
Y1 - 2009
N2 - Room temperature transport measurements of a gated graphene monolayer, whose field effect is tuned by an oxide backgate and an electrochemical gate, are presented. The graphene samples are obtained by mechanical exfoliation, and conductance as a function of gate voltage and molarity of the electrochemical solution is measured. The experimental data are then explained and fit by a transport theory using Rode's method and incorporating several scattering mechanisms such as acoustic phonon, optical phonon, remote impurity, and surface roughness scattering. The calculation shows impurity scattering and roughness scattering to be very important scattering mechanisms for room temperature graphene transport. Moreover, the disorder in graphene raises the value of minimum conductivity from the reported theoretical minimum.
AB - Room temperature transport measurements of a gated graphene monolayer, whose field effect is tuned by an oxide backgate and an electrochemical gate, are presented. The graphene samples are obtained by mechanical exfoliation, and conductance as a function of gate voltage and molarity of the electrochemical solution is measured. The experimental data are then explained and fit by a transport theory using Rode's method and incorporating several scattering mechanisms such as acoustic phonon, optical phonon, remote impurity, and surface roughness scattering. The calculation shows impurity scattering and roughness scattering to be very important scattering mechanisms for room temperature graphene transport. Moreover, the disorder in graphene raises the value of minimum conductivity from the reported theoretical minimum.
UR - http://www.scopus.com/inward/record.url?scp=68349141846&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=68349141846&partnerID=8YFLogxK
U2 - 10.1116/1.3156733
DO - 10.1116/1.3156733
M3 - Article
AN - SCOPUS:68349141846
SN - 1071-1023
VL - 27
SP - 2003
EP - 2007
JO - Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
JF - Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
IS - 4
ER -