Abstract
The influence of conductor particle size distribution on the blending curve of epoxy-based thick film resistors has been investigated. It was found that the critical volume fraction shifts to higher values as the spread of the conductor particle size distribution decreases. The results are interpreted in terms of a model whose main parameter is the contact probability for the conductor particles.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 277-284 |
| Number of pages | 8 |
| Journal | Electrocomponent Science and Technology |
| Volume | 10 |
| Issue number | 4 |
| DOIs | |
| State | Published - 1983 |
| Externally published | Yes |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering