Test planning for mixed-signal SOCs with wrapped analog cores

Keyphrases

• Mixed-signal 100%
• Testing Plan 100%
• Test Cost 66%
• Wrapper 66%
• Analog Test 66%
• Area Overhead 66%
• Test Scheduling 66%
• Digital Core 66%
• Test Access Mechanism 66%
• Test Wrapper 66%
• Optimization Methods 33%
• Test Development 33%
• Digital Test 33%
• Heuristic Approach 33%
• Development Methodology 33%
• Mechanism Optimization 33%
• Low-cost Experiments 33%
• Transi 33%
• Overall Test 33%
• Area Test 33%
• Embedded Cores 33%
• Cost-based 33%

Computer Science

• Access Mechanism 100%
• Level Simulation 50%
• Test Development 50%
• Experimental Result 50%
• Optimization Technique 50%
• Development Methodology 50%