Abstract
We present results in 1+1 and 2+1 dimensions for surface diffusion controlled profile relaxation for the solid-on-solid model above and below the roughening transition. For all cases examined we found that the characteristic time scale for the decay of a sinusoidal profile scaled with the wavelength L as Lz where 4. These results can be understood in terms of the anomalous diffusion displayed by tracer atoms whose root mean square displacement scaled as t1/4.
Original language | English (US) |
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Pages (from-to) | 1395-1398 |
Number of pages | 4 |
Journal | Physical Review Letters |
Volume | 74 |
Issue number | 8 |
DOIs | |
State | Published - 1995 |
ASJC Scopus subject areas
- General Physics and Astronomy