TY - GEN
T1 - Stumbling on extrinsic effects in super-hard nanobuttons
AU - Rinaldi, Antonio
AU - Peralta, Pedro
AU - Friesen, Cody
AU - Nahar, Dhiraj
AU - Licoccia, Silvia
AU - Traversa, Enrico
AU - Sieradzki, Karl
PY - 2010/11/29
Y1 - 2010/11/29
N2 - The compressive plastic strength of nanosized single crystal metallic pillars is known to depend on the diameter D, but little attention has been given to the pillar height h. The important role of h is analyzed here, observing the suppression of generalized crystal plasticity below a critical value hCR that can be estimated a priori. Novel in-situ compression tests on regular pillars (D = 300-900 nm) as well as nanobuttons (i.e. very short pillars with h less than hCR, such as D = 200 nm and h < 120 nm in this case) show that the latter ones are exceedingly harder than ordinary Ni pillars, withstanding stresses greater than 2 GPa. This h-controlled transition in the plastic behaviour is accompanied by extrinsic plastic effects in the harder nanobuttons. Such effects normally arise as Saint-Venant's assumption ceases to be accurate. Some bias related to those effects is identified and removed from test data. Our results underline that nanoscale testing is challenging when current methodology and technology are pushed to the limit.
AB - The compressive plastic strength of nanosized single crystal metallic pillars is known to depend on the diameter D, but little attention has been given to the pillar height h. The important role of h is analyzed here, observing the suppression of generalized crystal plasticity below a critical value hCR that can be estimated a priori. Novel in-situ compression tests on regular pillars (D = 300-900 nm) as well as nanobuttons (i.e. very short pillars with h less than hCR, such as D = 200 nm and h < 120 nm in this case) show that the latter ones are exceedingly harder than ordinary Ni pillars, withstanding stresses greater than 2 GPa. This h-controlled transition in the plastic behaviour is accompanied by extrinsic plastic effects in the harder nanobuttons. Such effects normally arise as Saint-Venant's assumption ceases to be accurate. Some bias related to those effects is identified and removed from test data. Our results underline that nanoscale testing is challenging when current methodology and technology are pushed to the limit.
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M3 - Conference contribution
AN - SCOPUS:78649261563
SN - 9781605111971
T3 - Materials Research Society Symposium Proceedings
SP - 227
EP - 232
BT - Mechanical Behavior at Small Scales - Experiments and Modeling
T2 - 2009 MRS Fall Meeting
Y2 - 29 November 2009 through 3 December 2009
ER -