Strain in coherent cobalt silicide islands formed by reactive epitaxy

Peter Bennett, David Smith, I. K. Robinson

Research output: Contribution to journalArticlepeer-review

11 Scopus citations


We have used surface X-ray diffraction (XRD) to measure strain in coherent islands of cobalt silicide formed by depositing 0-5 ML of cobalt on Si(1 1 1)-7 × 7 at various temperatures. Silicide structure is determined from truncation rod scans, while average island dimensions (width and height) and strain are determined from diffraction lineshapes and verified with TEM. At 800°C, the islands are fully coherent B-type CoSi 2 , approximately 8 nm thick and >300 nm wide, with atomically flat top and bottom surfaces. At 500°C, the islands are CoSi 2 , approximately 6 nm thick and 35 nm wide. The lattice parameter is ∼50% relaxed, primarily due to strain relief at the island edges. At 300°C and coverage of 2 ML, the islands are ∼3 nm high and ∼3 nm wide and show long-range position correlation due to registry with the substrate. At higher coverage, they are ∼4 nm high and ∼40 nm wide and commensurate, but lack long-range correlation. It appears that the silicide formed at 300°C is pseudomorphic Co 2 Si-θ for coverage below 2 ML, but is a mixture of CoSi 2 and metastable CoSi(CsCl) at higher coverage.

Original languageEnglish (US)
Pages (from-to)65-72
Number of pages8
JournalApplied Surface Science
Issue number1-2
StatePublished - Aug 1 2001


  • Coherent island
  • Reactive epitaxy
  • Silicide
  • Strain

ASJC Scopus subject areas

  • General Chemistry
  • Condensed Matter Physics
  • General Physics and Astronomy
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films


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