@inproceedings{dd5cc593e1c44f04a110834944d7840f,
title = "Spectral encoding based measurement of x-ray/optical relative delay to ≈10 fs rms",
abstract = "A recently demonstrated single-shot measurement of the relative delay between x-ray FEL pulses and optical laser pulses has now been improved to ≈10 fs rms error and has successfully been demonstrated for both soft and hard x-ray pulses. It is based on x-ray induced step-like reduction in optical transmissivity of a semiconductor membrane (Si3N4). The transmissivity is probed by an optical continuum spanning 450 - 650 nm where spectral chirp provides a mapping of the step in spectrum to the arrival time of the x-ray pulse relative to the optical laser system.",
keywords = "Dielectric response, FEL, LCLS, Spectral encoding, Thin films, Ultrafast dynamics, Ultrafast optics, Ultrafast x-rays",
author = "Bionta, {Mina R.} and Doug French and Cryan, {James P.} and Glownia, {James M.} and Nick Hartmann and Nicholson, {David J.} and Kevin Baker and Christoph Bostedt and Marco Cammarrata and Matthieu Chollet and Yuntao Ding and Fritz, {David M.} and Durbin, {Steve M.} and Yiping Feng and Marion Harmand and Fry, {Alan R.} and Kane, {Daniel J.} and Jacek Krzywinski and Lemke, {Henrik T.} and Marc Messerschmidt and Ratner, {Daniel F.} and Sebastian Schorb and Sven Toleikisj and Diling Zhu and White, {William E.} and Coffee, {Ryan N.}",
year = "2012",
doi = "10.1117/12.929097",
language = "English (US)",
isbn = "9780819492210",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
booktitle = "X-Ray Free-Electron Lasers",
note = "X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications ; Conference date: 13-08-2012 Through 16-08-2012",
}