Special session on BIST/calibration of A/MS devices

Hans Mart Von Staudt; James Izon; Sule Ozev; Peter Sarson

doi:10.1109/VTS.2018.8368653

Special session on BIST/calibration of A/MS devices

Hans Mart Von Staudt, James Izon, Sule Ozev, Peter Sarson

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

This special session will focus on new ways of performing calibration and test of on chip circuits that historically were performed on ATE. The presentation in this special session will demonstrate how these new test and calibration techniques help to reduce cost and increase the quality of semiconductor shipped into the field.

Original language	English (US)
Title of host publication	Proceedings - 2018 IEEE 36th VLSI Test Symposium, VTS 2018
Publisher	IEEE Computer Society
Pages	1
Number of pages	1
ISBN (Electronic)	9781538637746
DOIs	https://doi.org/10.1109/VTS.2018.8368653
State	Published - May 29 2018
Event	36th IEEE VLSI Test Symposium, VTS 2018 - San Francisco, United States Duration: Apr 22 2018 → Apr 25 2018

Publication series

Name	Proceedings of the IEEE VLSI Test Symposium
Volume	2018-April

Other

Other	36th IEEE VLSI Test Symposium, VTS 2018
Country/Territory	United States
City	San Francisco
Period	4/22/18 → 4/25/18

ASJC Scopus subject areas

Computer Science Applications
Electrical and Electronic Engineering

Access to Document

10.1109/VTS.2018.8368653

Cite this

Von Staudt, HM, Izon, J, Ozev, S & Sarson, P 2018, Special session on BIST/calibration of A/MS devices. in Proceedings - 2018 IEEE 36th VLSI Test Symposium, VTS 2018. Proceedings of the IEEE VLSI Test Symposium, vol. 2018-April, IEEE Computer Society, pp. 1, 36th IEEE VLSI Test Symposium, VTS 2018, San Francisco, United States, 4/22/18. https://doi.org/10.1109/VTS.2018.8368653

@inproceedings{eb964af9caf34e09b3a24ec8848461f7,

title = "Special session on BIST/calibration of A/MS devices",

abstract = "This special session will focus on new ways of performing calibration and test of on chip circuits that historically were performed on ATE. The presentation in this special session will demonstrate how these new test and calibration techniques help to reduce cost and increase the quality of semiconductor shipped into the field.",

author = "{Von Staudt}, {Hans Mart} and James Izon and Sule Ozev and Peter Sarson",

note = "Publisher Copyright: {\textcopyright} 2018 IEEE. Copyright: Copyright 2018 Elsevier B.V., All rights reserved.; 36th IEEE VLSI Test Symposium, VTS 2018 ; Conference date: 22-04-2018 Through 25-04-2018",

year = "2018",

month = may,

day = "29",

doi = "10.1109/VTS.2018.8368653",

language = "English (US)",

series = "Proceedings of the IEEE VLSI Test Symposium",

publisher = "IEEE Computer Society",

pages = "1",

booktitle = "Proceedings - 2018 IEEE 36th VLSI Test Symposium, VTS 2018",

}

TY - GEN

T1 - Special session on BIST/calibration of A/MS devices

AU - Von Staudt, Hans Mart

AU - Izon, James

AU - Ozev, Sule

AU - Sarson, Peter

PY - 2018/5/29

Y1 - 2018/5/29

N2 - This special session will focus on new ways of performing calibration and test of on chip circuits that historically were performed on ATE. The presentation in this special session will demonstrate how these new test and calibration techniques help to reduce cost and increase the quality of semiconductor shipped into the field.

AB - This special session will focus on new ways of performing calibration and test of on chip circuits that historically were performed on ATE. The presentation in this special session will demonstrate how these new test and calibration techniques help to reduce cost and increase the quality of semiconductor shipped into the field.

UR - http://www.scopus.com/inward/record.url?scp=85048368168&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85048368168&partnerID=8YFLogxK

U2 - 10.1109/VTS.2018.8368653

DO - 10.1109/VTS.2018.8368653

M3 - Conference contribution

AN - SCOPUS:85048368168

T3 - Proceedings of the IEEE VLSI Test Symposium

SP - 1

BT - Proceedings - 2018 IEEE 36th VLSI Test Symposium, VTS 2018

PB - IEEE Computer Society

T2 - 36th IEEE VLSI Test Symposium, VTS 2018

Y2 - 22 April 2018 through 25 April 2018

ER -

Special session on BIST/calibration of A/MS devices

Abstract

Publication series

Other

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this