Spatial Resolution in Aloof EELS

Ray Egerton; Yifan Wang; Peter A. Crozier

doi:10.1093/micmic/ozad067.169

Spatial Resolution in Aloof EELS

Ray Egerton
, Yifan Wang
, Peter A. Crozier

Engineering, Ira A. Fulton Schools of (IAFSE)

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Original language	English (US)
Pages (from-to)	362-364
Number of pages	3
Journal	Microscopy and Microanalysis
Volume	29
DOIs	https://doi.org/10.1093/micmic/ozad067.169
State	Published - Aug 1 2023

ASJC Scopus subject areas

Instrumentation

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title = "Spatial Resolution in Aloof EELS",

author = "Ray Egerton and Yifan Wang and Crozier, \{Peter A.\}",

year = "2023",

month = aug,

day = "1",

doi = "10.1093/micmic/ozad067.169",

language = "English (US)",

volume = "29",

pages = "362--364",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

}

TY - JOUR

T1 - Spatial Resolution in Aloof EELS

AU - Egerton, Ray

AU - Wang, Yifan

AU - Crozier, Peter A.

PY - 2023/8/1

Y1 - 2023/8/1

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UR - https://www.scopus.com/pages/publications/85212675168#tab=citedBy

U2 - 10.1093/micmic/ozad067.169

DO - 10.1093/micmic/ozad067.169

M3 - Article

AN - SCOPUS:85212675168

SN - 1431-9276

VL - 29

SP - 362

EP - 364

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

ER -

Spatial Resolution in Aloof EELS

ASJC Scopus subject areas

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