Abstract
We present kinetic lattice Monte Carlo simulations of Ge deposition onto a reconstructed Si (1 0 0) surface. We account for the exchange of Ge with Si atoms in the substrate, considering two different exchange mechanisms: a dimer exchange mechanism whereby Ge-Ge dimers on the surface become intermixed with substrate Si atoms, and the exchange of Ge atoms below the surface to relieve misfit strain. We examine how Si-Ge exchange affects the interface between the materials when the growth simulations are done at different temperatures.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 207-210 |
| Number of pages | 4 |
| Journal | Physica E: Low-Dimensional Systems and Nanostructures |
| Volume | 32 |
| Issue number | 1-2 SPEC. ISS. |
| DOIs | |
| State | Published - May 2006 |
Keywords
- Germanium
- Kinetic lattice Monte Carlo
- Silicon
- Strain
- Surface diffusion
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Condensed Matter Physics
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