Simple ion milling preparation of 〈111〉 tungsten tips

D. K. Biegelsen; F. A. Ponce; J. C. Tramontana

doi:10.1063/1.100722

Simple ion milling preparation of 〈111〉 tungsten tips

D. K. Biegelsen, F. A. Ponce, J. C. Tramontana

Research output: Contribution to journal › Article › peer-review

39 Scopus citations

Abstract

Ion milling of single-crystal tungsten 〈111〉 wire results in a steady-state faceted tip which is sharp on a near-atomic scale. The self-limiting nature of the process makes preparation particularly simple and therefore useful for applications such as scanning tunneling microscope tips, focused ion beam sources, etc.

Original language	English (US)
Pages (from-to)	1223-1225
Number of pages	3
Journal	Applied Physics Letters
Volume	54
Issue number	13
DOIs	https://doi.org/10.1063/1.100722
State	Published - 1989
Externally published	Yes

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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10.1063/1.100722

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title = "Simple ion milling preparation of 〈111〉 tungsten tips",

abstract = "Ion milling of single-crystal tungsten 〈111〉 wire results in a steady-state faceted tip which is sharp on a near-atomic scale. The self-limiting nature of the process makes preparation particularly simple and therefore useful for applications such as scanning tunneling microscope tips, focused ion beam sources, etc.",

author = "Biegelsen, {D. K.} and Ponce, {F. A.} and Tramontana, {J. C.}",

year = "1989",

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journal = "Applied Physics Letters",

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AU - Biegelsen, D. K.

AU - Ponce, F. A.

AU - Tramontana, J. C.

PY - 1989

Y1 - 1989

N2 - Ion milling of single-crystal tungsten 〈111〉 wire results in a steady-state faceted tip which is sharp on a near-atomic scale. The self-limiting nature of the process makes preparation particularly simple and therefore useful for applications such as scanning tunneling microscope tips, focused ion beam sources, etc.

AB - Ion milling of single-crystal tungsten 〈111〉 wire results in a steady-state faceted tip which is sharp on a near-atomic scale. The self-limiting nature of the process makes preparation particularly simple and therefore useful for applications such as scanning tunneling microscope tips, focused ion beam sources, etc.

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DO - 10.1063/1.100722

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SP - 1223

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JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 13

ER -

Simple ion milling preparation of 〈111〉 tungsten tips

Abstract

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