SILICON-SAPPHIRE INTERFACE: A HIGH RESOLUTION ELECTRON MICROSCOPY STUDY.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations
Original languageEnglish (US)
Title of host publicationMat Res Soc Symp Proc
Pages285-290
Number of pages6
StatePublished - Dec 1 1981
Externally publishedYes

Publication series

NameMat Res Soc Symp Proc

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

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