@inproceedings{bb802fa9fbe242c7adcea77660efe5fd,
title = "Self-correcting Flip-flops for Triple Modular Redundant Logic in a 12-nm Technology",
abstract = "Area efficient self-correcting flip-flops for use with triple modular redundant (TMR) soft-error hardened logic are implemented in a 12-nm finFET process technology. The TMR flip-flop slave latches self-correct in the clock low phase using Muller C-elements in the latch feedback. These C-elements are driven by the two redundant stored values and not by the slave latch itself, saving area over a similar implementation using majority gate feedback. These flip-flops are implemented as large shift-register arrays on a test chip and have been experimentally tested for their soft-error mitigation in static and dynamic modes of operation using heavy ions and protons. We show how high clock skew can result in susceptibility to soft-errors in the dynamic mode, and explain the potential failure mechanism.",
keywords = "heavy ion testing, proton testing, radiation hardening, soft errors, triple modular redundancy",
author = "Clark, {Lawrence T} and Alen Duvnjak and Clifford Young-Sciortino and Matthew Cannon and John Brunhaver and Sapan Agarwal and Jereme Neuendank and Donald Wilson and Hugh Barnaby and Matthew Marinella",
note = "Funding Information: This paper describes objective technical results and analysis. Any subjective views or opinions that might be expressed in the paper do not necessarily represent the views of the U.S. Department of Energy or the United States Government. Sandia National Laboratories is a multimission laboratory managed and operated by National Technology & Engineering Solutions of Sandia, LLC, a wholly owned subsidiary of Honeywell International Inc., for the U.S. Department of Energy{\textquoteright}s National Nuclear Security Administration under contract DENA0003525. Publisher Copyright: {\textcopyright} 2022 IEEE.; 2022 IEEE International Symposium on Circuits and Systems, ISCAS 2022 ; Conference date: 27-05-2022 Through 01-06-2022",
year = "2022",
doi = "10.1109/ISCAS48785.2022.9937935",
language = "English (US)",
series = "Proceedings - IEEE International Symposium on Circuits and Systems",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "1205--1209",
booktitle = "IEEE International Symposium on Circuits and Systems, ISCAS 2022",
}