@inproceedings{c5e8b3ab367f4927a4c92528290f6d98,
title = "Room temperature annealing effect on biased bipolar devices during switched dose-rate experiments",
abstract = "Unexpected recovery observed in previous dose-rate switching experiments is investigated. Irradiation and room-temperature annealing are performed on LM124 microcircuits and results are discussed in terms of hardness assurance.",
keywords = "Analog IC, Dose, ELDRS, Switched dose-rate technique, annealing, bipolar devices",
author = "Y. Gonzalez-Velo and J. Boch and F. Saign{\'e} and Roche, {N. J.H.} and S. P{\'e}rez and C. Deneau and Vaille, {J. R.} and L. Dusseau and Schrimpf, {R. D.} and E. Lorf{\`e}vre",
year = "2011",
month = dec,
day = "1",
doi = "10.1109/RADECS.2011.6131373",
language = "English (US)",
isbn = "9781457705878",
series = "Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS",
pages = "84--87",
booktitle = "RADECS 2011 - 12th European Conference on Radiation and Its Effects on Component and Systems, Conference Proceedings",
note = "12th European Conference on Radiation and Its Effects on Component and Systems, RADECS 2011 ; Conference date: 19-09-2011 Through 23-09-2011",
}