Response to comment on "The local structure of amorphous silicon"

Michael Treacy, K. B. Borisenko

Research output: Contribution to journalComment/debatepeer-review

13 Scopus citations


The averaged diffraction data alone cannot distinguish between models with different heterogeneous structures at length scales of about 2 nanometers, even when using high-resolution data. Although our approach to calculating diffraction intensities from the model differs from that of Roorda and Lewis, paracrystallinity in amorphous silicon is undeniably evident in the raw experimental fluctuation electron microscopy data.

Original languageEnglish (US)
Pages (from-to)1539-c
Issue number6114
StatePublished - Dec 21 2012

ASJC Scopus subject areas

  • General


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