Requirements driven falsification with coverage metrics

Adel Dokhanchi, Aditya Zutshi, Rahul T. Sriniva, Sriram Sankaranarayanan, Georgios Fainekos

Research output: Chapter in Book/Report/Conference proceedingConference contribution

19 Scopus citations


Specication guided falsication methods for hybrid systems have recently demonstrated their value in detecting design errors in models of safety critical systems. In specication guided falsication, the correctness problem, i.e., does the system satisfy the specication, is converted into an optimization problem where local negative minima indicate design errors. Due to the complexity of the resulting optimization problem, the problem is solved iteratively by performing a number of simulations on the system. Even though it is theoretically guaranteed that falsication methods will eventually find the bugs in the system, in practice, the performance of these methods, i.e., how many tests/simulations are executed before a bug is detected, depends on the specication, on the system and on the optimization method. In this paper, we define and utilize coverage metrics on the state space of hybrid systems in order to improve the performance of the falsication methods.

Original languageEnglish (US)
Title of host publication2015 Proceedings of the International Conference on Embedded Software, EMSOFT 2015
PublisherInstitute of Electrical and Electronics Engineers Inc.
Number of pages10
ISBN (Electronic)9781467380799
StatePublished - Nov 4 2015
Event13th International Conference on Embedded Software, EMSOFT 2015 - Amsterdam, Netherlands
Duration: Oct 4 2015Oct 9 2015

Publication series

Name2015 Proceedings of the International Conference on Embedded Software, EMSOFT 2015


Other13th International Conference on Embedded Software, EMSOFT 2015


  • Aerospace electronics
  • Measurement
  • Robustness
  • Semantics
  • Testing
  • Trajectory
  • Yttrium

ASJC Scopus subject areas

  • Software


Dive into the research topics of 'Requirements driven falsification with coverage metrics'. Together they form a unique fingerprint.

Cite this