@inproceedings{f3c296a071cd4d5586b3e581e7c02e10,
title = "Quantitative measurement and modeling of spontaneous emission efficiency of forward biased multi-junction solar cells",
abstract = "The spontaneous emission efficiency (η rad) of the subcells in a multi-junction solar cell under forward bias yields information about the subcell material quality. Electroluminesence measurement, calibrated with a technique that takes advantage of the luminescence coupling between subcells, is used to determine η rad as a function of injection current. The InGaAs subcell's η rad is also fitted to a device model using the PC1D drift-diffusion simulation software to extract the SRH lifetime of the p-n junction base region.",
author = "Lim, {Swee H.} and Li, {Jing Jing} and Allen, {Charles R.} and Yong-Hang Zhang",
year = "2011",
month = dec,
day = "1",
doi = "10.1109/PVSC.2011.6186286",
language = "English (US)",
isbn = "9781424499656",
series = "Conference Record of the IEEE Photovoltaic Specialists Conference",
pages = "1721--1725",
booktitle = "Program - 37th IEEE Photovoltaic Specialists Conference, PVSC 2011",
note = "37th IEEE Photovoltaic Specialists Conference, PVSC 2011 ; Conference date: 19-06-2011 Through 24-06-2011",
}