Abstract
To record low-dose high resolution electron microscope (HREM) images from zeolites with the combination with real-space averaging techniques has been shown to be successful using a slow-scan CCD camera in obtaining the averaged unit cell with high signal-to-noise ratio (SNR). The paper shows that the CCD camera can be used to make meaningful and quantitative intensity measurements of images and diffraction patterns from zeolites. Quantitative measurement of diffraction intensities and comparison with dynamical calculations have also been carried out for ZSM-5.
| Original language | English (US) |
|---|---|
| Title of host publication | Proceedings - Annual Meeting, Microscopy Society of America |
| Publisher | Publ by San Francisco Press Inc |
| Pages | 670-671 |
| Number of pages | 2 |
| State | Published - 1993 |
| Event | Proceedings of the 51st Annual Meeting Microscopy Society of America - Cincinnati, OH, USA Duration: Aug 1 1993 → Aug 6 1993 |
Other
| Other | Proceedings of the 51st Annual Meeting Microscopy Society of America |
|---|---|
| City | Cincinnati, OH, USA |
| Period | 8/1/93 → 8/6/93 |
ASJC Scopus subject areas
- General Engineering