Quantifying the semiconducting fraction in single-walled carbon nanotube samples through comparative atomic force and photoluminescence microscopies

Anton V. Naumov; Oleg A. Kuznetsov; Avetik R. Harutyunyan; Alexander A. Green; Mark C. Hersam; Daniel E. Resasco; Pavel N. Nikolaev; R. Bruce Weisman

doi:10.1021/nl9014342

Quantifying the semiconducting fraction in single-walled carbon nanotube samples through comparative atomic force and photoluminescence microscopies

Anton V. Naumov
, Oleg A. Kuznetsov
, Avetik R. Harutyunyan
, Alexander A. Green
, Mark C. Hersam
, Daniel E. Resasco
, Pavel N. Nikolaev
, R. Bruce Weisman

Research output: Contribution to journal › Article › peer-review

61 Scopus citations

Abstract

A new method was used to measure the fraction of semiconducting nanotubes in various as-grown or processed single-walled carbon nanotube (SWCNT) samples. SWCNT number densities were compared in images from near-IR photoluminescence (semiconducting species) and AFM (all species) to compute the semiconducting fraction. The results show large variations among growth methods and effective sorting by density gradient ultracentrifugation. This counting-based method provides important information about SWCNT sample compositions that can guide controlled growth methods and help calibrate bulk characterization techniques.

Original language	English (US)
Pages (from-to)	3203-3208
Number of pages	6
Journal	Nano Letters
Volume	9
Issue number	9
DOIs	https://doi.org/10.1021/nl9014342
State	Published - Sep 9 2009
Externally published	Yes

ASJC Scopus subject areas

Bioengineering
General Chemistry
General Materials Science
Condensed Matter Physics
Mechanical Engineering

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10.1021/nl9014342

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title = "Quantifying the semiconducting fraction in single-walled carbon nanotube samples through comparative atomic force and photoluminescence microscopies",

abstract = "A new method was used to measure the fraction of semiconducting nanotubes in various as-grown or processed single-walled carbon nanotube (SWCNT) samples. SWCNT number densities were compared in images from near-IR photoluminescence (semiconducting species) and AFM (all species) to compute the semiconducting fraction. The results show large variations among growth methods and effective sorting by density gradient ultracentrifugation. This counting-based method provides important information about SWCNT sample compositions that can guide controlled growth methods and help calibrate bulk characterization techniques.",

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AU - Naumov, Anton V.

AU - Kuznetsov, Oleg A.

AU - Harutyunyan, Avetik R.

AU - Green, Alexander A.

AU - Hersam, Mark C.

AU - Resasco, Daniel E.

AU - Nikolaev, Pavel N.

AU - Weisman, R. Bruce

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AB - A new method was used to measure the fraction of semiconducting nanotubes in various as-grown or processed single-walled carbon nanotube (SWCNT) samples. SWCNT number densities were compared in images from near-IR photoluminescence (semiconducting species) and AFM (all species) to compute the semiconducting fraction. The results show large variations among growth methods and effective sorting by density gradient ultracentrifugation. This counting-based method provides important information about SWCNT sample compositions that can guide controlled growth methods and help calibrate bulk characterization techniques.

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Quantifying the semiconducting fraction in single-walled carbon nanotube samples through comparative atomic force and photoluminescence microscopies

Abstract

ASJC Scopus subject areas

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