Profile imaging of surfaces and surface reactions

David Smith, Rob W. Glaisher, Ping Lu, Martha McCartney

Research output: Contribution to journalArticlepeer-review

26 Scopus citations


The technique of profile imaging in the high-resolution electron microscope can be used to provide information about surfaces and surface reactions. Applications of the method to metals, oxides, semiconductors and small particles, as well as electron-beam-induced surface reactions, are reviewed. The role of image simulations and the need for ultra-high-vacuum and specimen-treatment facilities are also discussed.

Original languageEnglish (US)
Pages (from-to)123-134
Number of pages12
Issue number1-4
StatePublished - May 2 1989

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation


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