Profile imaging of surfaces and surface reactions

David Smith; Rob W. Glaisher; Ping Lu; Martha McCartney

doi:10.1016/0304-3991(89)90238-6

Profile imaging of surfaces and surface reactions

David Smith, Rob W. Glaisher, Ping Lu, Martha McCartney

Research output: Contribution to journal › Article › peer-review

26 Scopus citations

Abstract

The technique of profile imaging in the high-resolution electron microscope can be used to provide information about surfaces and surface reactions. Applications of the method to metals, oxides, semiconductors and small particles, as well as electron-beam-induced surface reactions, are reviewed. The role of image simulations and the need for ultra-high-vacuum and specimen-treatment facilities are also discussed.

Original language	English (US)
Pages (from-to)	123-134
Number of pages	12
Journal	Ultramicroscopy
Volume	29
Issue number	1-4
DOIs	https://doi.org/10.1016/0304-3991(89)90238-6
State	Published - May 2 1989

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Instrumentation

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10.1016/0304-3991(89)90238-6

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title = "Profile imaging of surfaces and surface reactions",

abstract = "The technique of profile imaging in the high-resolution electron microscope can be used to provide information about surfaces and surface reactions. Applications of the method to metals, oxides, semiconductors and small particles, as well as electron-beam-induced surface reactions, are reviewed. The role of image simulations and the need for ultra-high-vacuum and specimen-treatment facilities are also discussed.",

author = "David Smith and Glaisher, {Rob W.} and Ping Lu and Martha McCartney",

note = "Funding Information: We are grateful for support from National Science Foundation Grant DMR-8514583 and from Office for Naval Research MAPS Special Focus Program.",

year = "1989",

month = may,

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doi = "10.1016/0304-3991(89)90238-6",

language = "English (US)",

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journal = "Ultramicroscopy",

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TY - JOUR

T1 - Profile imaging of surfaces and surface reactions

AU - Smith, David

AU - Glaisher, Rob W.

AU - Lu, Ping

AU - McCartney, Martha

N1 - Funding Information: We are grateful for support from National Science Foundation Grant DMR-8514583 and from Office for Naval Research MAPS Special Focus Program.

PY - 1989/5/2

Y1 - 1989/5/2

N2 - The technique of profile imaging in the high-resolution electron microscope can be used to provide information about surfaces and surface reactions. Applications of the method to metals, oxides, semiconductors and small particles, as well as electron-beam-induced surface reactions, are reviewed. The role of image simulations and the need for ultra-high-vacuum and specimen-treatment facilities are also discussed.

AB - The technique of profile imaging in the high-resolution electron microscope can be used to provide information about surfaces and surface reactions. Applications of the method to metals, oxides, semiconductors and small particles, as well as electron-beam-induced surface reactions, are reviewed. The role of image simulations and the need for ultra-high-vacuum and specimen-treatment facilities are also discussed.

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U2 - 10.1016/0304-3991(89)90238-6

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JO - Ultramicroscopy

JF - Ultramicroscopy

IS - 1-4

ER -

Profile imaging of surfaces and surface reactions

Abstract

ASJC Scopus subject areas

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