The technique of profile imaging in the high-resolution electron microscope can be used to provide information about surfaces and surface reactions. Applications of the method to metals, oxides, semiconductors and small particles, as well as electron-beam-induced surface reactions, are reviewed. The role of image simulations and the need for ultra-high-vacuum and specimen-treatment facilities are also discussed.
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics