Abstract
We have studied untreated photosystem II (PSII) membrane using tapping mode atomic force microscopy (AFM). The individual PSII particles distribute randomly in the membrane. Near the center of each particle, our AFM reveals an intramolecular cavity which confirms the previous electron microscopy of stained samples. The cavity can be reversibly enlarged from a few nm to as many as 40 nm in diameter by increasing the force on the AFM tip. A study of the particle's apparent height and cavity size under various forces provides unique information about the microelastic properties of single PSII particles.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 37-41 |
| Number of pages | 5 |
| Journal | Chemical Physics Letters |
| Volume | 273 |
| Issue number | 1-2 |
| DOIs | |
| State | Published - Jul 11 1997 |
ASJC Scopus subject areas
- Physics and Astronomy(all)
- Physical and Theoretical Chemistry