Prediction of scour depth around bridge piers using Gaussian process

Rajesh Kumar Neerukatti, Inho Kim, Masoud Yekani Fard, Aditi Chattopadhyay

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations

Abstract

A reliable prognostics framework is essential to prevent catastrophic failure of bridges due to scour. In the U.S., scour accounts for almost 60% of bridge failures. Currently available techniques in the literature for predicting scour are mostly based on empirical equations and deterministic regression models, like Neural Networks and Support Vector Machines, and do not predict the evolution of scour over time. In this paper, we will discuss a Gaussian process model, which includes Bayesian uncertainty for prediction of time-dependent scour evolution. We will validate the model on the experimental data conducted in four different flumes in different conditions. The robustness of the algorithm will also be demonstrated under different scenarios, like lack of training data and equilibrium scour conditions. The results indicate that the algorithm is able to predict the scour evolution with an error of less than 20% for most of the time, and 5% or less given enough training data.

Original languageEnglish (US)
Title of host publicationSensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2013
DOIs
StatePublished - 2013
Event2013 SPIE Conference on Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2013 - San Diego, CA, United States
Duration: Mar 10 2013Mar 14 2013

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume8692
ISSN (Print)0277-786X

Other

Other2013 SPIE Conference on Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems 2013
Country/TerritoryUnited States
CitySan Diego, CA
Period3/10/133/14/13

Keywords

  • Gaussian process
  • Prediction of scour depth
  • Temporal scour

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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