Potential induced degradation of pre-stressed photovoltaic modules: Effect of glass surface conductivity disruption

S. Tatapudi, F. Ebneali, J. Kuitche, G. Tamizhmani

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    8 Scopus citations


    Potential induced degradation (PID) due to high system voltages is considered as one of the possible degradation mechanisms of PV modules in the field. In the previous studies carried out at ASU-PRL, the surface conductivity of the entire glass was obtained using either conductive carbon layer (covering the entire glass surface and extending it to the frame) or humidity inside an environmental chamber. This study investigates the influence of disruption of glass surface conductivity on the PID. In this study, the conductive carbon layer was applied on the module's glass surface but without extending it to the frame and hence the surface conductivity was disrupted (no carbon layer) at 2 cm distance from the periphery of frame's inner edges. This study was carried out on the modules of different manufacturers under dry heat conditions at multiple stress temperatures and voltages. To replicate closeness to the field-aged modules, half of the selected modules for the PID investigation were pre-stressed under damp heat for 1000 hours and the other half under thermal cycling for 200 cycles. When the surface continuity was disrupted, the degradation was found to be absent or negligibly small even after 35 hours of negative bias at elevated temperatures. This preliminary study appears to indicate that the modules could become immune to PID losses if the continuity of the glass surface conductivity is disrupted at the inside boundary of the frame. The surface conductivity of the glass, due to water layer formation in a humid condition, close to the frame could be disrupted just by applying a transparent hydrophobic layer near the inner edges of the frame or by attaching the frameless laminate with the conductivity disrupting mounting methods such as glue-on rail on the backsheet.

    Original languageEnglish (US)
    Title of host publication39th IEEE Photovoltaic Specialists Conference, PVSC 2013
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    Number of pages6
    ISBN (Print)9781479932993
    StatePublished - Jan 1 2013
    Event39th IEEE Photovoltaic Specialists Conference, PVSC 2013 - Tampa, FL, United States
    Duration: Jun 16 2013Jun 21 2013

    Publication series

    NameConference Record of the IEEE Photovoltaic Specialists Conference
    ISSN (Print)0160-8371


    Other39th IEEE Photovoltaic Specialists Conference, PVSC 2013
    Country/TerritoryUnited States
    CityTampa, FL


    • Durability
    • Leakage current
    • Potential induced degradation
    • Reliability
    • System voltage

    ASJC Scopus subject areas

    • Control and Systems Engineering
    • Industrial and Manufacturing Engineering
    • Electrical and Electronic Engineering


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