Polarization Type Potential Induced Degradation under Positive Bias in a Commercial PERC Module

Farrukh Ibne Mahmood; Fang Li; Peter Hacke; Cécile Molto; Hubert Siegneur; Govinda Samy Tamizhmani

doi:10.1109/PVSC48320.2023.10359620

Polarization Type Potential Induced Degradation under Positive Bias in a Commercial PERC Module

Farrukh Ibne Mahmood, Fang Li, Peter Hacke, Cécile Molto, Hubert Siegneur, Govinda Samy Tamizhmani

Polytechnic Engineering Programs (EGR)

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Potential induced degradation of the polarization type (PID-p) can reduce module performance in a relatively short period of time. PID-p can occur at both voltage polarities, but most studies are focused on degradation under a negative bias. This paper uses commercial bifacial passivated emitter and rear contact (PERC) cells within a monofacial glass-backsheet module construction to evaluate the impact of PID-p under a positive bias on the front side. Using the aluminum-foil (Al-foil) method, the module was stressed for PID in an environmental chamber. After the stress, the maximum power (Pmax) showed a decline of 3.1% at 1000 W/m² and 6.2% at 200 W/m². Recovery under light was also investigated. Complete recovery was observed at high irradiance, while a partial recovery was seen at lower irradiance. The outcomes of this study can help in understanding PID-p degradation under a positive bias and its recovery under the light.

Original language	English (US)
Title of host publication	2023 IEEE 50th Photovoltaic Specialists Conference, PVSC 2023
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781665460590
DOIs	https://doi.org/10.1109/PVSC48320.2023.10359620
State	Published - 2023
Event	50th IEEE Photovoltaic Specialists Conference, PVSC 2023 - San Juan, United States Duration: Jun 11 2023 → Jun 16 2023

Publication series

Name	Conference Record of the IEEE Photovoltaic Specialists Conference
ISSN (Print)	0160-8371

Conference

Conference	50th IEEE Photovoltaic Specialists Conference, PVSC 2023
Country/Territory	United States
City	San Juan
Period	6/11/23 → 6/16/23

Keywords

PERC
polarization
positive bias
potential induced degradation
recovery

ASJC Scopus subject areas

Control and Systems Engineering
Industrial and Manufacturing Engineering
Electrical and Electronic Engineering

Access to Document

10.1109/PVSC48320.2023.10359620

Cite this

Mahmood, F. I., Li, F., Hacke, P., Molto, C., Siegneur, H., & Tamizhmani, G. S. (2023). Polarization Type Potential Induced Degradation under Positive Bias in a Commercial PERC Module. In 2023 IEEE 50th Photovoltaic Specialists Conference, PVSC 2023 (Conference Record of the IEEE Photovoltaic Specialists Conference). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/PVSC48320.2023.10359620

Polarization Type Potential Induced Degradation under Positive Bias in a Commercial PERC Module. / Mahmood, Farrukh Ibne; Li, Fang; Hacke, Peter et al.
2023 IEEE 50th Photovoltaic Specialists Conference, PVSC 2023. Institute of Electrical and Electronics Engineers Inc., 2023. (Conference Record of the IEEE Photovoltaic Specialists Conference).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Mahmood, FI, Li, F, Hacke, P, Molto, C, Siegneur, H & Tamizhmani, GS 2023, Polarization Type Potential Induced Degradation under Positive Bias in a Commercial PERC Module. in 2023 IEEE 50th Photovoltaic Specialists Conference, PVSC 2023. Conference Record of the IEEE Photovoltaic Specialists Conference, Institute of Electrical and Electronics Engineers Inc., 50th IEEE Photovoltaic Specialists Conference, PVSC 2023, San Juan, United States, 6/11/23. https://doi.org/10.1109/PVSC48320.2023.10359620

Mahmood FI, Li F, Hacke P, Molto C, Siegneur H, Tamizhmani GS. Polarization Type Potential Induced Degradation under Positive Bias in a Commercial PERC Module. In 2023 IEEE 50th Photovoltaic Specialists Conference, PVSC 2023. Institute of Electrical and Electronics Engineers Inc. 2023. (Conference Record of the IEEE Photovoltaic Specialists Conference). doi: 10.1109/PVSC48320.2023.10359620

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abstract = "Potential induced degradation of the polarization type (PID-p) can reduce module performance in a relatively short period of time. PID-p can occur at both voltage polarities, but most studies are focused on degradation under a negative bias. This paper uses commercial bifacial passivated emitter and rear contact (PERC) cells within a monofacial glass-backsheet module construction to evaluate the impact of PID-p under a positive bias on the front side. Using the aluminum-foil (Al-foil) method, the module was stressed for PID in an environmental chamber. After the stress, the maximum power (Pmax) showed a decline of 3.1% at 1000 W/m2 and 6.2% at 200 W/m2. Recovery under light was also investigated. Complete recovery was observed at high irradiance, while a partial recovery was seen at lower irradiance. The outcomes of this study can help in understanding PID-p degradation under a positive bias and its recovery under the light.",

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AU - Siegneur, Hubert

AU - Tamizhmani, Govinda Samy

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AB - Potential induced degradation of the polarization type (PID-p) can reduce module performance in a relatively short period of time. PID-p can occur at both voltage polarities, but most studies are focused on degradation under a negative bias. This paper uses commercial bifacial passivated emitter and rear contact (PERC) cells within a monofacial glass-backsheet module construction to evaluate the impact of PID-p under a positive bias on the front side. Using the aluminum-foil (Al-foil) method, the module was stressed for PID in an environmental chamber. After the stress, the maximum power (Pmax) showed a decline of 3.1% at 1000 W/m2 and 6.2% at 200 W/m2. Recovery under light was also investigated. Complete recovery was observed at high irradiance, while a partial recovery was seen at lower irradiance. The outcomes of this study can help in understanding PID-p degradation under a positive bias and its recovery under the light.

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Polarization Type Potential Induced Degradation under Positive Bias in a Commercial PERC Module

Abstract

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Conference

Keywords

ASJC Scopus subject areas

Access to Document

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