Abstract
We show, with use of a field-emission scanning transmission electron microscope, changes in the plasmon region from thin films of silicon in a cobalt matrix. These effects are consistent with the dielectric-response theory developed by Howie.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 9182-9184 |
| Number of pages | 3 |
| Journal | Physical Review B |
| Volume | 42 |
| Issue number | 14 |
| DOIs | |
| State | Published - 1990 |
ASJC Scopus subject areas
- Condensed Matter Physics