Periodic steady-state thermal analysis of a high-Tc superconducting microbolometer

Kazuyoshi Fushinobu, Patrick E. Phelan, Kunio Hijikata, Takao Nagasaki, M. I. Flik

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations


Microbolometers are infrared detectors whose sensitivity depends on their thermal response to chopped incident radiation. Numerical analysis of the three-dimensional complex temperature fields in the superconducting film and the substrate shows that the conductance between the film and the substrate is a sensitive function of frequency above a critical frequency, which depends on the substrate thermal diffusivity and the film/substrate contact area. An approximate analysis, which models the film as a hemisphere embedded in the substrate, yields a temperature increase that is at most 25 percent too high. The finite film volume and the substrate thickness both significantly influence the film-substrate conductance under certain conditions.

Original languageEnglish (US)
Title of host publicationHeat Transfer on the Microscale
PublisherPubl by ASME
Number of pages7
ISBN (Print)0791809269
StatePublished - Dec 1 1992
Externally publishedYes
Event28th National Heat Transfer Conference and Exhibition - San Diego, CA, USA
Duration: Aug 9 1992Aug 12 1992

Publication series

NameAmerican Society of Mechanical Engineers, Heat Transfer Division, (Publication) HTD
ISSN (Print)0272-5673


Other28th National Heat Transfer Conference and Exhibition
CitySan Diego, CA, USA

ASJC Scopus subject areas

  • Mechanical Engineering
  • Fluid Flow and Transfer Processes


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