Performance test of amorphous silicon modules in different climates - Year three: Higher minimum operating temperatures lead to higher performance levels

R. Rüther, G. Tamizh-Mani, J. Del Cueto, J. Adelstein, M. M. Dacoregio, B. Von Roedern

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    14 Scopus citations

    Abstract

    This paper presents third year results of a round robin exposure experiment designed to assess the performance of thin-film amorphous silicon (a-Si) solar modules operating in different climatic conditions. Three identical sets of commercially available a-Si PV modules from five different manufacturers were simultaneously deployed outdoors in three sites with distinct climates (Arizona -USA, Colorado - USA and Florianopolis - Brazil). Every year all PV module sets were sent to the National Renewable Energy Laboratory (NREL) for Standard Testing Conditions measurements under a SPIRE simulator. The four-year experiment aims to determine the light-induced degradation and stabilization characteristics of a-Si regarding specific history of exposure, and to monitor and compare degradation rates in different climates. We present results from the first three years of measurements, showing that while most of the manufacturers underrate their products by 20 to 25% to account for the light-induced degradation, outdoor exposure temperature seems to be what will ultimately determine the stabilized performance level of a-Si.

    Original languageEnglish (US)
    Title of host publicationConference Record of the 31st IEEE Photovoltaic Specialists Conference - 2005
    Pages1635-1638
    Number of pages4
    DOIs
    StatePublished - Nov 30 2005
    Event31st IEEE Photovoltaic Specialists Conference - 2005 - Lake Buena Vista, FL, United States
    Duration: Jan 3 2005Jan 7 2005

    Publication series

    NameConference Record of the IEEE Photovoltaic Specialists Conference
    ISSN (Print)0160-8371

    Other

    Other31st IEEE Photovoltaic Specialists Conference - 2005
    Country/TerritoryUnited States
    CityLake Buena Vista, FL
    Period1/3/051/7/05

    ASJC Scopus subject areas

    • Control and Systems Engineering
    • Industrial and Manufacturing Engineering
    • Electrical and Electronic Engineering

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