TY - GEN
T1 - Performance test of amorphous silicon modules in different climates - Year three
T2 - 31st IEEE Photovoltaic Specialists Conference - 2005
AU - Rüther, R.
AU - Tamizh-Mani, G.
AU - Del Cueto, J.
AU - Adelstein, J.
AU - Dacoregio, M. M.
AU - Von Roedern, B.
PY - 2005/11/30
Y1 - 2005/11/30
N2 - This paper presents third year results of a round robin exposure experiment designed to assess the performance of thin-film amorphous silicon (a-Si) solar modules operating in different climatic conditions. Three identical sets of commercially available a-Si PV modules from five different manufacturers were simultaneously deployed outdoors in three sites with distinct climates (Arizona -USA, Colorado - USA and Florianopolis - Brazil). Every year all PV module sets were sent to the National Renewable Energy Laboratory (NREL) for Standard Testing Conditions measurements under a SPIRE simulator. The four-year experiment aims to determine the light-induced degradation and stabilization characteristics of a-Si regarding specific history of exposure, and to monitor and compare degradation rates in different climates. We present results from the first three years of measurements, showing that while most of the manufacturers underrate their products by 20 to 25% to account for the light-induced degradation, outdoor exposure temperature seems to be what will ultimately determine the stabilized performance level of a-Si.
AB - This paper presents third year results of a round robin exposure experiment designed to assess the performance of thin-film amorphous silicon (a-Si) solar modules operating in different climatic conditions. Three identical sets of commercially available a-Si PV modules from five different manufacturers were simultaneously deployed outdoors in three sites with distinct climates (Arizona -USA, Colorado - USA and Florianopolis - Brazil). Every year all PV module sets were sent to the National Renewable Energy Laboratory (NREL) for Standard Testing Conditions measurements under a SPIRE simulator. The four-year experiment aims to determine the light-induced degradation and stabilization characteristics of a-Si regarding specific history of exposure, and to monitor and compare degradation rates in different climates. We present results from the first three years of measurements, showing that while most of the manufacturers underrate their products by 20 to 25% to account for the light-induced degradation, outdoor exposure temperature seems to be what will ultimately determine the stabilized performance level of a-Si.
UR - http://www.scopus.com/inward/record.url?scp=27944461061&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=27944461061&partnerID=8YFLogxK
U2 - 10.1109/PVSC.2005.1488459
DO - 10.1109/PVSC.2005.1488459
M3 - Conference contribution
AN - SCOPUS:27944461061
SN - 0780387074
T3 - Conference Record of the IEEE Photovoltaic Specialists Conference
SP - 1635
EP - 1638
BT - Conference Record of the 31st IEEE Photovoltaic Specialists Conference - 2005
Y2 - 3 January 2005 through 7 January 2005
ER -