Part-to-part and lot-to-lot variability study of TID effects in bipolar linear devices

J. Guillermin, N. Sukhaseum, A. Varotsou, A. Privat, P. Garcia, M. Vaillé, J. C. Thomas, N. Chatry, C. Poivey

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

10 Scopus citations

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Engineering