Optimized EVM testing for IEEE 802.11a/n RF ICs

Erkan Acar, Sule Ozev, Ganesh Srinivasan, Friedrich Taenzler

Research output: Chapter in Book/Report/Conference proceedingConference contribution

10 Scopus citations


Characterization of RF ICs based on their error vector magnitude (EVM) is gaining a lot of attention in the industry. In order to deliver this specification at a reasonable cost, the input test signal and the analysis techniques have to be optimized such that EVM testing can provide a robust pass/fail decision while utilizing a reasonable amount of tester resources. In this paper, we propose techniques to optimize EVM testing, both from input signal generation and from output analysis perspectives. Our goal is to achieve both efficient and reliable test approaches for WLAN (Wireless Local Area Networks) circuits.

Original languageEnglish (US)
Title of host publicationProceedings - International Test Conference 2008, ITC 2008
StatePublished - 2008
Externally publishedYes
EventInternational Test Conference 2008, ITC 2008 - Santa Clara, CA, United States
Duration: Oct 28 2008Oct 30 2008

Publication series

NameProceedings - International Test Conference
ISSN (Print)1089-3539


OtherInternational Test Conference 2008, ITC 2008
Country/TerritoryUnited States
CitySanta Clara, CA

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Applied Mathematics


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