Abstract
First experimental results on a Philips EM 400 TEM/STEM fitted with a field-emission electron gun and objective ″twin lens″ are given here. Operation of the FEG is reliable up to maximum design voltage (120 kV). Highest resolution achieved in TEM was 1. 9 A fringe. A wide variety of diffraction modes were demonstrated, ranging from CBDP from a small area ( similar 10 A dia) in STEM mode to SAD with angular resolution of 8 mu rad in TEM mode. The EDS sensitivity is very high. STEM imaging performance to the highest magnifications examined (200 kx) is good. Work is in progress to evaluate the limits of STEM performance.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 153-160 |
| Number of pages | 8 |
| Journal | Scanning Electron Microscopy |
| Issue number | pt 1 |
| State | Published - Jan 1 1979 |
| Externally published | Yes |
| Event | Pap presented at a Meet - Washington, DC, USA Duration: Apr 16 1979 → Apr 20 1979 |
ASJC Scopus subject areas
- Control and Systems Engineering
- Biophysics