On the measurement of thickness in nanoporous materials by EELS

Nan Jiang; Dong Su; John Spence

doi:10.1016/j.ultramic.2010.09.011

On the measurement of thickness in nanoporous materials by EELS

Nan Jiang, Dong Su, John Spence

Research output: Contribution to journal › Article › peer-review

5 Scopus citations

Abstract

This work discusses thickness measurements in nanoporous MgO using the log-ratio method in electron energy-loss spectroscopy (EELS). In heterogeneous nanoporous systems, the method can induce large errors if the strength of excitations at interfaces between pores and the matrix is large. In homogeneous nanoporous systems, on the other hand, the log-ratio method is still valid, but the inelastic scattering mean-free-path is no longer equal to that in the same bulk system.

Original language	English (US)
Pages (from-to)	62-65
Number of pages	4
Journal	Ultramicroscopy
Volume	111
Issue number	1
DOIs	https://doi.org/10.1016/j.ultramic.2010.09.011
State	Published - Dec 2010

Keywords

EELS
Nanoporous
Thickness

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics
Instrumentation

Access to Document

10.1016/j.ultramic.2010.09.011

Cite this

@article{435824f130d54d1ebc1275802d5f7f77,

title = "On the measurement of thickness in nanoporous materials by EELS",

abstract = "This work discusses thickness measurements in nanoporous MgO using the log-ratio method in electron energy-loss spectroscopy (EELS). In heterogeneous nanoporous systems, the method can induce large errors if the strength of excitations at interfaces between pores and the matrix is large. In homogeneous nanoporous systems, on the other hand, the log-ratio method is still valid, but the inelastic scattering mean-free-path is no longer equal to that in the same bulk system.",

keywords = "EELS, Nanoporous, Thickness",

author = "Nan Jiang and Dong Su and John Spence",

note = "Funding Information: This work is supported by NSF Award DMR0603993 . The use of facilities within the Center for Solid State Science at ASU is also acknowledged.",

year = "2010",

month = dec,

doi = "10.1016/j.ultramic.2010.09.011",

language = "English (US)",

volume = "111",

pages = "62--65",

journal = "Ultramicroscopy",

issn = "0304-3991",

publisher = "Elsevier",

number = "1",

}

TY - JOUR

T1 - On the measurement of thickness in nanoporous materials by EELS

AU - Jiang, Nan

AU - Su, Dong

AU - Spence, John

N1 - Funding Information: This work is supported by NSF Award DMR0603993 . The use of facilities within the Center for Solid State Science at ASU is also acknowledged.

PY - 2010/12

Y1 - 2010/12

N2 - This work discusses thickness measurements in nanoporous MgO using the log-ratio method in electron energy-loss spectroscopy (EELS). In heterogeneous nanoporous systems, the method can induce large errors if the strength of excitations at interfaces between pores and the matrix is large. In homogeneous nanoporous systems, on the other hand, the log-ratio method is still valid, but the inelastic scattering mean-free-path is no longer equal to that in the same bulk system.

AB - This work discusses thickness measurements in nanoporous MgO using the log-ratio method in electron energy-loss spectroscopy (EELS). In heterogeneous nanoporous systems, the method can induce large errors if the strength of excitations at interfaces between pores and the matrix is large. In homogeneous nanoporous systems, on the other hand, the log-ratio method is still valid, but the inelastic scattering mean-free-path is no longer equal to that in the same bulk system.

KW - EELS

KW - Nanoporous

KW - Thickness

UR - http://www.scopus.com/inward/record.url?scp=78649476260&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=78649476260&partnerID=8YFLogxK

U2 - 10.1016/j.ultramic.2010.09.011

DO - 10.1016/j.ultramic.2010.09.011

M3 - Article

C2 - 21036477

AN - SCOPUS:78649476260

SN - 0304-3991

VL - 111

SP - 62

EP - 65

JO - Ultramicroscopy

JF - Ultramicroscopy

IS - 1

ER -

On the measurement of thickness in nanoporous materials by EELS

Abstract

Keywords

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this