On-chip measurement of bandgap reference voltage using a small form factor VCO based zoom-in ADC

Osman Emir Erol; Sule Ozev; Chandra Suresh; Rubin Parekhji; Lakshmanan Balasubramanian

doi:10.7873/date.2015.1003

On-chip measurement of bandgap reference voltage using a small form factor VCO based zoom-in ADC

Osman Emir Erol, Sule Ozev, Chandra Suresh, Rubin Parekhji, Lakshmanan Balasubramanian

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

3 Scopus citations

Abstract

A robust and scalable technique for measuring the output voltage of a band-gap reference (BGR) circuit is described. The proposed technique is based on an ADC architecture that uses a voltage controlled oscillator (VCO) for voltage to frequency conversion. During production testing, an external voltage reference is used to approximate the voltage/frequency characteristics of the VCO with 5ms test time. The proposed zoom-in ADC approach is manufactured with 0.5μm CMOS process. Measurement results indicate that 12 bits of resolution within the measurement range can be achieved with the zoom-in approach. Worst-case INL for the ADC is less than 0.25LSB (50μV).

Original language	English (US)
Title of host publication	Proceedings of the 2015 Design, Automation and Test in Europe Conference and Exhibition, DATE 2015
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	1559-1562
Number of pages	4
ISBN (Electronic)	9783981537048
DOIs	https://doi.org/10.7873/date.2015.1003
State	Published - Apr 22 2015
Event	2015 Design, Automation and Test in Europe Conference and Exhibition, DATE 2015 - Grenoble, France Duration: Mar 9 2015 → Mar 13 2015

Publication series

Name	Proceedings -Design, Automation and Test in Europe, DATE
Volume	2015-April
ISSN (Print)	1530-1591

Other

Other	2015 Design, Automation and Test in Europe Conference and Exhibition, DATE 2015
Country/Territory	France
City	Grenoble
Period	3/9/15 → 3/13/15

ASJC Scopus subject areas

Engineering(all)

Access to Document

10.7873/date.2015.1003

Cite this

Erol, O. E., Ozev, S., Suresh, C., Parekhji, R., & Balasubramanian, L. (2015). On-chip measurement of bandgap reference voltage using a small form factor VCO based zoom-in ADC. In Proceedings of the 2015 Design, Automation and Test in Europe Conference and Exhibition, DATE 2015 (pp. 1559-1562). Article 7092638 (Proceedings -Design, Automation and Test in Europe, DATE; Vol. 2015-April). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.7873/date.2015.1003

On-chip measurement of bandgap reference voltage using a small form factor VCO based zoom-in ADC. / Erol, Osman Emir; Ozev, Sule; Suresh, Chandra et al.
Proceedings of the 2015 Design, Automation and Test in Europe Conference and Exhibition, DATE 2015. Institute of Electrical and Electronics Engineers Inc., 2015. p. 1559-1562 7092638 (Proceedings -Design, Automation and Test in Europe, DATE; Vol. 2015-April).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Erol, OE, Ozev, S, Suresh, C, Parekhji, R & Balasubramanian, L 2015, On-chip measurement of bandgap reference voltage using a small form factor VCO based zoom-in ADC. in Proceedings of the 2015 Design, Automation and Test in Europe Conference and Exhibition, DATE 2015., 7092638, Proceedings -Design, Automation and Test in Europe, DATE, vol. 2015-April, Institute of Electrical and Electronics Engineers Inc., pp. 1559-1562, 2015 Design, Automation and Test in Europe Conference and Exhibition, DATE 2015, Grenoble, France, 3/9/15. https://doi.org/10.7873/date.2015.1003

Erol OE, Ozev S, Suresh C, Parekhji R, Balasubramanian L. On-chip measurement of bandgap reference voltage using a small form factor VCO based zoom-in ADC. In Proceedings of the 2015 Design, Automation and Test in Europe Conference and Exhibition, DATE 2015. Institute of Electrical and Electronics Engineers Inc. 2015. p. 1559-1562. 7092638. (Proceedings -Design, Automation and Test in Europe, DATE). doi: 10.7873/date.2015.1003

Erol, Osman Emir ; Ozev, Sule ; Suresh, Chandra et al. / On-chip measurement of bandgap reference voltage using a small form factor VCO based zoom-in ADC. Proceedings of the 2015 Design, Automation and Test in Europe Conference and Exhibition, DATE 2015. Institute of Electrical and Electronics Engineers Inc., 2015. pp. 1559-1562 (Proceedings -Design, Automation and Test in Europe, DATE).

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abstract = "A robust and scalable technique for measuring the output voltage of a band-gap reference (BGR) circuit is described. The proposed technique is based on an ADC architecture that uses a voltage controlled oscillator (VCO) for voltage to frequency conversion. During production testing, an external voltage reference is used to approximate the voltage/frequency characteristics of the VCO with 5ms test time. The proposed zoom-in ADC approach is manufactured with 0.5μm CMOS process. Measurement results indicate that 12 bits of resolution within the measurement range can be achieved with the zoom-in approach. Worst-case INL for the ADC is less than 0.25LSB (50μV).",

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AB - A robust and scalable technique for measuring the output voltage of a band-gap reference (BGR) circuit is described. The proposed technique is based on an ADC architecture that uses a voltage controlled oscillator (VCO) for voltage to frequency conversion. During production testing, an external voltage reference is used to approximate the voltage/frequency characteristics of the VCO with 5ms test time. The proposed zoom-in ADC approach is manufactured with 0.5μm CMOS process. Measurement results indicate that 12 bits of resolution within the measurement range can be achieved with the zoom-in approach. Worst-case INL for the ADC is less than 0.25LSB (50μV).

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On-chip measurement of bandgap reference voltage using a small form factor VCO based zoom-in ADC

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