Abstract
Photovoltaic (PV) module degradation in the field is a known issue; however, understanding the modes and mechanisms in which modules degrade is still a major undertaking for researchers. To understand the degradation modes and mechanisms, both nondestructive and destructive characterization techniques need to be employed. This paper presents the results and conclusions obtained based on a few major nondestructive techniques. In this paper nine, 18 years old modules exposed in a hot-dry climate were acquired and investigated in the laboratory to identify the degradation modes and to determine the degradation rate. The nondestructive techniques utilized in this work are: current-voltage measurements (I-V), visual inspection (VI), diode failure (DF), infrared (IR) imaging, electroluminescence (EL) imaging, dark current-voltage (D-I-V) nondestructive cell-module quantum efficiency (C-M-QE), and module level reflectance spectroscopy (M-RS).
Original language | English (US) |
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Title of host publication | 2015 IEEE 42nd Photovoltaic Specialist Conference, PVSC 2015 |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
ISBN (Electronic) | 9781479979448 |
DOIs | |
State | Published - Dec 14 2015 |
Event | 42nd IEEE Photovoltaic Specialist Conference, PVSC 2015 - New Orleans, United States Duration: Jun 14 2015 → Jun 19 2015 |
Other
Other | 42nd IEEE Photovoltaic Specialist Conference, PVSC 2015 |
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Country/Territory | United States |
City | New Orleans |
Period | 6/14/15 → 6/19/15 |
Keywords
- materials
- Non-destructive
- photovoltaic cells
- Quantum Efficiency
- Reflectance
- Reliability
- silicon
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Electronic, Optical and Magnetic Materials