Modulated nanostructure characterization using aberration corrected STEM

Ray Carpenter, Ronit Sawant, Toshihiro Aoki

Research output: Contribution to journal › Article › peer-review

Original language	English (US)
Journal	Microscopy and Microanalysis
DOIs	https://doi.org/10.1017/S1431927620016876
State	Accepted/In press - 2020

ASJC Scopus subject areas

@article{e57cf4dbea5347f39089d2b24c1cfdfc,

title = "Modulated nanostructure characterization using aberration corrected STEM",

author = "Ray Carpenter and Ronit Sawant and Toshihiro Aoki",

year = "2020",

doi = "10.1017/S1431927620016876",

language = "English (US)",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

}

TY - JOUR

T1 - Modulated nanostructure characterization using aberration corrected STEM

AU - Carpenter, Ray

AU - Sawant, Ronit

AU - Aoki, Toshihiro

PY - 2020

Y1 - 2020

UR - http://www.scopus.com/inward/record.url?scp=85094867104&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85094867104&partnerID=8YFLogxK

U2 - 10.1017/S1431927620016876

DO - 10.1017/S1431927620016876

M3 - Article

AN - SCOPUS:85094867104

SN - 1431-9276

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

ER -