Abstract
Modulated molecular beam epitaxy (MMBE) has been demonstrated to be useful in controlling group-V alloys such as InAsxSb1-x and AlAsxSb1-x. Further studies of the MMBE grown InAsxSb1-x ordered alloys and InAs/InAsxSb1-x superlattices by using cross-sectional scanning tunneling microscopy show well defined interfaces between InAsxSb1-x ordered alloys and InAs. Clear composition modulation is observed in the InAsxSb1-x ordered alloy layers. Transmission electron diffraction and microscopy, X-ray diffraction, and low temperature photoluminescence experiments show no obvious sign of CuPt orderings. These results suggest that MMBE provides a possible means to bypass the ordering problem of InAsxSb1-x random alloys.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 833-837 |
| Number of pages | 5 |
| Journal | Journal of Crystal Growth |
| Volume | 175-176 |
| Issue number | PART 2 |
| DOIs | |
| State | Published - May 1997 |
Keywords
- InAs
- InAsSb
- InSb
- MBE
- STM
- TEM
ASJC Scopus subject areas
- Condensed Matter Physics
- Inorganic Chemistry
- Materials Chemistry
Fingerprint
Dive into the research topics of 'Microstructural properties of InAs/InAsxSb1-x superlattices and InASxSb1-x ordered alloys grown by modulated molecular beam epitaxy'. Together they form a unique fingerprint.Cite this
- APA
- Standard
- Harvard
- Vancouver
- Author
- BIBTEX
- RIS