Abstract
Parameters are identified which give different pinning positions on n- and p-type semiconductor materials. Experimentally, Cs is in disagreement with any metallic approximation at the interface. Results for thick noble metals (Au, Cu, and Ag) deposited on clean GaAs(110) formed by cleaving in UHV are reported. An atomic explanation is suggested and related to interfacial chemistry. Differences are found between the thin and thick pinning positions of Al on GaAs.
Original language | English (US) |
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Pages (from-to) | 476-480 |
Number of pages | 5 |
Journal | Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures |
Volume | 2 |
Issue number | 3 |
DOIs | |
State | Published - 1984 |
Externally published | Yes |
Event | Proc of the Annu Conf on the Phys and Chem of Semicond Interfaces, 11th - Pinehurst, NC, USA Duration: Jan 31 1984 → Feb 2 1984 |
ASJC Scopus subject areas
- Condensed Matter Physics
- Electrical and Electronic Engineering