Abstract
In a previous paper we studied the Young's and shear modulus of a high-angle twist grain boundary (Σ5) in Cu, using the EAM, and related it to the uniaxial strain derivatives of single crystals. In this paper, we discuss elastic properties of ten additional twist grain boundaries, from 8.8-43.6°. The monolayer Young's modulus at each boundary was calculated and found to be 20-50% higher than the bulk value for all eleven boundaries for both csl and type1 structures. The monolayer shear modulus at each boundary was calculated and found to be 93-98% lower than the bulk value for six grain boundaries with csl structure and found to decrease with increasing twist angle. The critical shear stress was also calculated for eleven boundaries with csl structure and found to roughly decrease with increasing twist angle.
Original language | English (US) |
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Pages (from-to) | 137-146 |
Number of pages | 10 |
Journal | Interface Science |
Volume | 2 |
Issue number | 2 |
DOIs | |
State | Published - Jun 1 1994 |
Externally published | Yes |
Keywords
- Grain boundaries
- computer simulation
- mechanical properties
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Materials Science(all)
- Condensed Matter Physics