Measuring ultralow emittance of laser-driven electron beams with spectroscopic imaging of inverse-Compton scattered x-rays

G. Golovin; S. Banerjee; C. Liu; S. Chen; J. Zhang; B. Zhao; P. Zhang; M. Veale; M. Wilson; P. Seller; D. Umstadter

doi:10.1364/FIO.2016.FTu1C.3

Measuring ultralow emittance of laser-driven electron beams with spectroscopic imaging of inverse-Compton scattered x-rays

G. Golovin
, S. Banerjee
, C. Liu
, S. Chen
, J. Zhang
, B. Zhao
, P. Zhang
, M. Veale
, M. Wilson
, P. Seller
, D. Umstadter

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

We report the first measurement of laser-wakefield-accelerated electron beam transverse emittance, as well as its evolution, performed via a novel, non-destructive, and singleshot technique employing spectroscopic imaging of x-rays produced by inverse-Compton scattering.

Original language	English (US)
Title of host publication	Frontiers in Optics, FiO 2016
Publisher	Optica Publishing Group (formerly OSA)
ISBN (Print)	9781943580194
DOIs	https://doi.org/10.1364/FIO.2016.FTu1C.3
State	Published - 2016
Externally published	Yes
Event	Frontiers in Optics, FiO 2016 - Rochester, United States Duration: Oct 17 2016 → Oct 21 2016

Publication series

Name	Optics InfoBase Conference Papers
ISSN (Electronic)	2162-2701

Conference

Conference	Frontiers in Optics, FiO 2016
Country/Territory	United States
City	Rochester
Period	10/17/16 → 10/21/16

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Mechanics of Materials

Access to Document

10.1364/FIO.2016.FTu1C.3

Cite this

Golovin, G., Banerjee, S., Liu, C., Chen, S., Zhang, J., Zhao, B., Zhang, P., Veale, M., Wilson, M., Seller, P., & Umstadter, D. (2016). Measuring ultralow emittance of laser-driven electron beams with spectroscopic imaging of inverse-Compton scattered x-rays. In Frontiers in Optics, FiO 2016 (Optics InfoBase Conference Papers). Optica Publishing Group (formerly OSA). https://doi.org/10.1364/FIO.2016.FTu1C.3

Measuring ultralow emittance of laser-driven electron beams with spectroscopic imaging of inverse-Compton scattered x-rays. / Golovin, G.; Banerjee, S.; Liu, C. et al.
Frontiers in Optics, FiO 2016. Optica Publishing Group (formerly OSA), 2016. (Optics InfoBase Conference Papers).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Golovin, G, Banerjee, S, Liu, C, Chen, S, Zhang, J, Zhao, B, Zhang, P, Veale, M, Wilson, M, Seller, P & Umstadter, D 2016, Measuring ultralow emittance of laser-driven electron beams with spectroscopic imaging of inverse-Compton scattered x-rays. in Frontiers in Optics, FiO 2016. Optics InfoBase Conference Papers, Optica Publishing Group (formerly OSA), Frontiers in Optics, FiO 2016, Rochester, United States, 10/17/16. https://doi.org/10.1364/FIO.2016.FTu1C.3

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title = "Measuring ultralow emittance of laser-driven electron beams with spectroscopic imaging of inverse-Compton scattered x-rays",

abstract = "We report the first measurement of laser-wakefield-accelerated electron beam transverse emittance, as well as its evolution, performed via a novel, non-destructive, and singleshot technique employing spectroscopic imaging of x-rays produced by inverse-Compton scattering.",

author = "G. Golovin and S. Banerjee and C. Liu and S. Chen and J. Zhang and B. Zhao and P. Zhang and M. Veale and M. Wilson and P. Seller and D. Umstadter",

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doi = "10.1364/FIO.2016.FTu1C.3",

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AU - Golovin, G.

AU - Banerjee, S.

AU - Liu, C.

AU - Chen, S.

AU - Zhang, J.

AU - Zhao, B.

AU - Zhang, P.

AU - Veale, M.

AU - Wilson, M.

AU - Seller, P.

AU - Umstadter, D.

PY - 2016

Y1 - 2016

N2 - We report the first measurement of laser-wakefield-accelerated electron beam transverse emittance, as well as its evolution, performed via a novel, non-destructive, and singleshot technique employing spectroscopic imaging of x-rays produced by inverse-Compton scattering.

AB - We report the first measurement of laser-wakefield-accelerated electron beam transverse emittance, as well as its evolution, performed via a novel, non-destructive, and singleshot technique employing spectroscopic imaging of x-rays produced by inverse-Compton scattering.

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DO - 10.1364/FIO.2016.FTu1C.3

M3 - Conference contribution

AN - SCOPUS:85165737795

SN - 9781943580194

T3 - Optics InfoBase Conference Papers

BT - Frontiers in Optics, FiO 2016

PB - Optica Publishing Group (formerly OSA)

T2 - Frontiers in Optics, FiO 2016

Y2 - 17 October 2016 through 21 October 2016

ER -

Measuring ultralow emittance of laser-driven electron beams with spectroscopic imaging of inverse-Compton scattered x-rays

Abstract

Publication series

Conference

ASJC Scopus subject areas

Access to Document

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