TY - JOUR
T1 - Measurement of lattice-fringe vectors from digital HREM images
T2 - experimental precision
AU - de Ruijter, W. J.
AU - Sharma, R.
AU - McCartney, Martha
AU - Smith, David
N1 - Funding Information:
W.J.R. thanksM .L. Leber at Gatan Research and Developmentf or his help in developingt he image and diffraction analysisp lug-in for Digi-talMicrograph. This work at the Center for High Resolution Electron Microscopy at Arizona State University was supportedb y NSF grant DMR 86-11609a nd DMR 89-13384.
PY - 1995/3
Y1 - 1995/3
N2 - The practical measurement of lattice-fringe spacings and angles recorded in digital high-resolution electron micrographs is evaluated experimentally. The method is based on a statistical estimation procedure and involves computer analysis of reciprocal-space parameters. This work concentrates on the analysis of images recorded with slow-scan CCD cameras, but alternative methods of image pick-up are also briefly considered. The method has been successfully applied to images recorded with electron doses smaller than 1eÅ2 and for sample dimensions as small as 8Åacross. The practical precision depends on specimen characteristics, electron dose and the size of the measurement area and is in the range of 0.001-0.05Åfor lattice spacings, and 0.1°-0.5° for lattice-plane angles. Finally, the technique is demonstrated in studies of a catalyst system, of a reduced surface oxide phase and of TiO2 and TiN particles.
AB - The practical measurement of lattice-fringe spacings and angles recorded in digital high-resolution electron micrographs is evaluated experimentally. The method is based on a statistical estimation procedure and involves computer analysis of reciprocal-space parameters. This work concentrates on the analysis of images recorded with slow-scan CCD cameras, but alternative methods of image pick-up are also briefly considered. The method has been successfully applied to images recorded with electron doses smaller than 1eÅ2 and for sample dimensions as small as 8Åacross. The practical precision depends on specimen characteristics, electron dose and the size of the measurement area and is in the range of 0.001-0.05Åfor lattice spacings, and 0.1°-0.5° for lattice-plane angles. Finally, the technique is demonstrated in studies of a catalyst system, of a reduced surface oxide phase and of TiO2 and TiN particles.
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U2 - 10.1016/0304-3991(94)00166-K
DO - 10.1016/0304-3991(94)00166-K
M3 - Article
AN - SCOPUS:0028965792
SN - 0304-3991
VL - 57
SP - 409
EP - 422
JO - Ultramicroscopy
JF - Ultramicroscopy
IS - 4
ER -