Mapping of Local Defects and Voltages in Solar Cells using Non-Contact Electrostatic Voltmeter Method

Hamza Ahmad Raza, Govindasamy Tamizhmani

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

Underperforming cells in a photovoltaic (PV) module or the modules in a PV string are typically detected and mapped using electroluminescence (EL) infrared (IR) imaging, and current voltage (IV) curve techniques. In the current work, a non-contact electrostatic voltmeter (ESV) technique is presented to detect and map the underperforming spots in a cell and the cells in a module. The ESV technique relies on the voltage mapping of the charged surface of the superstrate glass. The voltage values obtained using ESV at various good and poor performing spots of the cells have been validated using the voltage values obtained in EL analysis. The difference between EL-derived voltage and ESV-measured voltage is determined to be less than 2%. In this work, we combine the strengths of two complementary techniques of ESV (strength: quantitative) and EL (strength: spatial mapping) to obtain a quantitative spatial mapping of defects. This work is further extendable to detect poor performing modules in PV power plants.

Original languageEnglish (US)
Title of host publication2022 IEEE 49th Photovoltaics Specialists Conference, PVSC 2022
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages261-263
Number of pages3
ISBN (Electronic)9781728161174
DOIs
StatePublished - 2022
Event49th IEEE Photovoltaics Specialists Conference, PVSC 2022 - Philadelphia, United States
Duration: Jun 5 2022Jun 10 2022

Publication series

NameConference Record of the IEEE Photovoltaic Specialists Conference
Volume2022-June
ISSN (Print)0160-8371

Conference

Conference49th IEEE Photovoltaics Specialists Conference, PVSC 2022
Country/TerritoryUnited States
CityPhiladelphia
Period6/5/226/10/22

Keywords

  • Crack detection
  • electroluminescence
  • electrostatic voltmeter
  • solar cell characterization

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Industrial and Manufacturing Engineering
  • Electrical and Electronic Engineering

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