Layout Dependence of Total Ionizing Dose Effects on 12-nm Bulk FinFET Core Digital Structures

T. Wallace, M. Spear, A. Privat, J. Neuendank, G. Irumva, D. Wilson, I. Sanchez Esqueda, H. J. Barnaby, M. Turowski, E. Mikkola, D. Hughart, M. J. Marinella, J. Brunhaver, Amos Gutierrez, R. Von Niederhausern, S. Holloway, D. Beltran, J. L. Taggart

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Fingerprint

Dive into the research topics of 'Layout Dependence of Total Ionizing Dose Effects on 12-nm Bulk FinFET Core Digital Structures'. Together they form a unique fingerprint.

Physics & Astronomy

Engineering & Materials Science