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Late Breaking Results: Machine Learning Based Reference Ripple Error Suppression in Successive Approximation Register Analog-to-Digital Converters

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This work presents a machine learning (ML) technique to suppress reference ripple errors in successive approximation register (SAR) analog-to-digital converter (ADC). Reference voltage ripple due to switching in SAR ADC introduces dynamic error which manifests as spurs in the output spectrum and limits ADC resolution. Conventional techniques to suppress reference ripple require large decoupling capacitor and high-speed reference voltage buffer which consume large area and power. The proposed ML approach uses a supervised technique in which a low-speed 10MHz SAR ADC is used for learning and correcting reference ripple error in a 200MHz SAR ADC. Simulated in 28nm CMOS technology, the proposed ML approach reduces overall ADC power consumption by 4.9x without degrading performance.

Original languageEnglish (US)
Title of host publicationProceedings of the 61st ACM/IEEE Design Automation Conference, DAC 2024
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9798400706011
DOIs
StatePublished - Nov 7 2024
Event61st ACM/IEEE Design Automation Conference, DAC 2024 - San Francisco, United States
Duration: Jun 23 2024Jun 27 2024

Publication series

NameProceedings - Design Automation Conference
ISSN (Print)0738-100X

Conference

Conference61st ACM/IEEE Design Automation Conference, DAC 2024
Country/TerritoryUnited States
CitySan Francisco
Period6/23/246/27/24

Keywords

  • Analog-to-digital converter
  • Machine learning
  • Reference ripple

ASJC Scopus subject areas

  • Computer Science Applications
  • Control and Systems Engineering
  • Electrical and Electronic Engineering
  • Modeling and Simulation

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