TY - JOUR
T1 - Investigation and analysis of LM124 bipolar linear circuitry response phenomenon in pulsed X-ray environment
AU - Roche, Nicolas J.H.
AU - Dusseau, L.
AU - Vaillé, J. R.
AU - Mekki, J.
AU - Velo, Y. Gonzalez
AU - Perez, S.
AU - Boch, J.
AU - Saigné, F.
AU - Marec, R.
AU - Calvel, P.
AU - Bezerra, F.
AU - Auriel, G.
AU - Azaïs, B.
N1 - Funding Information:
Manuscript received July 16, 2010; revised September 08, 2010 and October 13, 2010; accepted October 13, 2010. Date of current version December 15, 2010. This work was supported in part by the Délégation Générale pour l’Arme-ment, the Centre National d’Etudes Spatiales and Thalès alenia Space. N. J.-H. Roche, L. Dusseau, J.-R. Vaillé, J. Mekki, Y. Gonzalez Velo, S. Perez, J. Boch, and F. Saigné are with the Université Montpellier II, IES—UMR CNRS 5214, F-34095 Montpellier cedex 5, France (e-mail: [email protected]). J-R. Vaillé is also with Université de Nîmes, Rue du docteur Salan 30021 Nîmes Cedex 01, France. R. Marec and P. Calvel are with Thales Alenia Space, B.P. 33787, F-31037 Toulouse cedex 1, France. F. Bezerra is with CNES, Centre National des Etudes Spatiales, F-31401 Toulouse cedex 9, France. G. Auriel is with CEA, Comissariat à l’Energie Atomique et aux Energies Alternatives, F-46500 -Gramat, France. B. Azaïs is with DGA, Direction Générale de l’Armement, F-92221—Bag-neux cedex, France. Digital Object Identifier 10.1109/TNS.2010.2089063
PY - 2010/12
Y1 - 2010/12
N2 - Analog Transient Radiation Effects in Electronics (ATREE) induced by high dose-rate X-ray pulses are investigated using a flash X-ray facility. The ATREEs induced in a LM124 operational amplifier configured in three different bias configurations are investigated. A predictive methodology, based upon a previously developed ASET simulation tool, is used to model the ATREE phenomena. A semiempirical physical model is used to perform the correlation between the duration of the parasitic pulse signal induced in the LM124 and an equivalent value of the high dose-rate X-ray pulse level.
AB - Analog Transient Radiation Effects in Electronics (ATREE) induced by high dose-rate X-ray pulses are investigated using a flash X-ray facility. The ATREEs induced in a LM124 operational amplifier configured in three different bias configurations are investigated. A predictive methodology, based upon a previously developed ASET simulation tool, is used to model the ATREE phenomena. A semiempirical physical model is used to perform the correlation between the duration of the parasitic pulse signal induced in the LM124 and an equivalent value of the high dose-rate X-ray pulse level.
KW - Bipolar analog integrated circuits
KW - integrated circuit modeling
KW - ionizing dose
KW - single event transient
KW - transient propagation
KW - transient response
UR - https://www.scopus.com/pages/publications/78650410158
UR - https://www.scopus.com/pages/publications/78650410158#tab=citedBy
U2 - 10.1109/TNS.2010.2089063
DO - 10.1109/TNS.2010.2089063
M3 - Article
AN - SCOPUS:78650410158
SN - 0018-9499
VL - 57
SP - 3392
EP - 3399
JO - IEEE Transactions on Nuclear Science
JF - IEEE Transactions on Nuclear Science
IS - 6 PART 1
M1 - 5658011
ER -