Abstract
We report a high-aluminum-containing ([Al] ∼0.6) AlGaN multiple-quantum well (MQW) double-heterojunction (DH) emitter employing an inverse-tapered-composition AlGaN:Mg p-type waveguide grown on a c plane Al-polar AlN bulk substrate. Using numerical simulations, we have determined that the inverse-tapered p-type waveguide design is necessary for high [Al] containing p-n junction devices as any valence band discontinuity at the junction will limit the vertical hole transport and induce a larger voltage-drop across the structure. The fabricated ultraviolet MQW DH emitter can sustain a DC current of at least 500 mA and a pulsed current of at least 1.07 A, which corresponds to a current density of 10 and 18 kA/cm ^{2} at maximum measured voltage of 15 and 20 V with the measured series resistance of 15 and 11 Ω , respectively.
Original language | English (US) |
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Article number | 7120925 |
Pages (from-to) | 1768-1771 |
Number of pages | 4 |
Journal | IEEE Photonics Technology Letters |
Volume | 27 |
Issue number | 16 |
DOIs | |
State | Published - Aug 15 2015 |
Keywords
- AlGaN active layer
- AlN substrate
- deep ultraviolet laser diodes
- epitaxial growth
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Electrical and Electronic Engineering