Abstract
This work describes an approach to interpret the near-edge fine structure of electron energy-loss spectroscopy (EELS) of O K-edge in zircon using a structural variation method. The positions and intensities of several peaks in the O K-edge EELS spectrum are assigned to specific structural parameters. It suggests that the near-edge structures in EELS can be used to measure atomic structure changes.
Original language | English (US) |
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Pages (from-to) | 89-93 |
Number of pages | 5 |
Journal | Ultramicroscopy |
Volume | 110 |
Issue number | 1 |
DOIs | |
State | Published - Jan 2009 |
Keywords
- EELS
- O K-edge
- Structural variation
- Zircon
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Instrumentation