Inter-laboratory study of eddy-current measurement of excess-carrier recombination lifetime

Adrienne L. Blum, James S. Swirhun, Ronald A. Sinton, Fei Yan, Stanislau Herasimenka, Thomas Roth, Kevin Lauer, Jonas Haunschild, Bianca Lim, Karsten Bothe, Ziv Hameiri, Bjoern Seipel, Rentian Xiong, Marwan Dhamrin, John D. Murphy

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations


Excess-carrier recombination lifetime is a key parameter in silicon solar cell design and production. With the vast international use and recent standardization (SEMI PV13) of eddy-current wafer and brick silicon lifetime test instruments, it is important to quantify the inter- and intra-laboratory repeatability. This paper presents results of an international inter-laboratory study conducted with 24 participants to determine the precision of the SEMI PV13 eddy-current carrier lifetime measurement test method. Overall, the carrier recombination lifetime between-laboratory reproducibility was found to be within ±11% for quasi-steady-state (QSS) mode and ±8% for transient mode for wafer samples and within ±4% for bulk samples.

Original languageEnglish (US)
Title of host publication39th IEEE Photovoltaic Specialists Conference, PVSC 2013
PublisherInstitute of Electrical and Electronics Engineers Inc.
Number of pages6
ISBN (Print)9781479932993
StatePublished - 2013
Event39th IEEE Photovoltaic Specialists Conference, PVSC 2013 - Tampa, FL, United States
Duration: Jun 16 2013Jun 21 2013

Publication series

NameConference Record of the IEEE Photovoltaic Specialists Conference
ISSN (Print)0160-8371


Other39th IEEE Photovoltaic Specialists Conference, PVSC 2013
Country/TerritoryUnited States
CityTampa, FL


  • Charge carrier lifetime
  • Eddy currents
  • Photoconductivity
  • Silicon

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Industrial and Manufacturing Engineering
  • Electrical and Electronic Engineering


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