TY - GEN
T1 - Influence of Module Architecture and Humidity on Local Module Degradation
AU - Kumar, Rishi E.
AU - Von Gastrow, Guillaume
AU - Theut, Nicholas
AU - Jeffries, April M.
AU - Sidawi, Tala
AU - Ha, Angel
AU - Deplachett, Flavia
AU - Moctezuma-Andraca, Hugo
AU - Donaldson, Seth
AU - Bertoni, Mariana I.
AU - Fenning, David P.
N1 - Funding Information:
This work was supported by the U.S. Department of Energy’s Office of Energy Efficiency and Renewable Energy under Solar Energy Technologies Office Agreement DE-EE0008160.(Corresponding author: David P. Fenning.)
Publisher Copyright:
© 2021 IEEE.
PY - 2021/6/20
Y1 - 2021/6/20
N2 - Moisture ingress is an established issue for photovoltaic module durability. Durability studies probing moisture effects typically evaluate performance losses at the module level, attributing global power losses to the overall humidity condition of the test environment while leaving local module behavior unknown. We leverage our recently published optical moisture quantification method (water reflectometry detection, WaRD) and biased photoluminescence imaging to spatially correlate module moisture content and cell performance over the course of accelerated damp heat tests. These tests, carried out on glass-glass and glass-backsheet module packages at various temperatures and humidities, reveal two dominant modes of local cell performance loss - acute finger interruptions and global series resistance (Rs) increase. We show that acute failures are more prevalent in glass-glass packages and not influenced by local module moisture dose, and that background Rs increase is greatest in glass-backsheet packages at higher humidity conditions.
AB - Moisture ingress is an established issue for photovoltaic module durability. Durability studies probing moisture effects typically evaluate performance losses at the module level, attributing global power losses to the overall humidity condition of the test environment while leaving local module behavior unknown. We leverage our recently published optical moisture quantification method (water reflectometry detection, WaRD) and biased photoluminescence imaging to spatially correlate module moisture content and cell performance over the course of accelerated damp heat tests. These tests, carried out on glass-glass and glass-backsheet module packages at various temperatures and humidities, reveal two dominant modes of local cell performance loss - acute finger interruptions and global series resistance (Rs) increase. We show that acute failures are more prevalent in glass-glass packages and not influenced by local module moisture dose, and that background Rs increase is greatest in glass-backsheet packages at higher humidity conditions.
KW - Degradation
KW - Durability
KW - Moisture
KW - Silicon
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U2 - 10.1109/PVSC43889.2021.9518508
DO - 10.1109/PVSC43889.2021.9518508
M3 - Conference contribution
AN - SCOPUS:85115925965
T3 - Conference Record of the IEEE Photovoltaic Specialists Conference
SP - 1576
EP - 1578
BT - 2021 IEEE 48th Photovoltaic Specialists Conference, PVSC 2021
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 48th IEEE Photovoltaic Specialists Conference, PVSC 2021
Y2 - 20 June 2021 through 25 June 2021
ER -