Abstract
Materials at the micrometer and submicrometer scale exhibit mechanical properties that are substantially different from bulk materials. With the increasing miniaturization ofdevices, an accurate characterization of micro/nanoscale materials is necessary to ensuretheir reliability and performance. Precise characterization is also essential for a fundamental understanding of mechanisms that govern size dependent material responses. In thispaper we review methods for uniaxial mechanical testing, which directly provides mechanical properties without an apriori model, for micro/nanoscale materials with an emphasis onin situ testing. We outline the challenges involved in imposing pure uniaxial deformationon micro/nanoscale specimens and detail strategies (self aligning mechanisms, for example) that ensure a uniform stress state in the specimens, a critical criterion for uniaxial test.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 282-287 |
| Number of pages | 6 |
| Journal | Nanoscience and Nanotechnology Letters |
| Volume | 2 |
| Issue number | 4 |
| DOIs | |
| State | Published - Dec 2010 |
| Externally published | Yes |
Keywords
- Electron microscopy
- In situ uniaxial test
- Micro/nanomaterials
- Microelectromechanical devices
- Thin film
ASJC Scopus subject areas
- General Materials Science
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