@inproceedings{f70e65efbf7142aca95322a0891d4384,
title = "In-Flight Demonstration of Enhanced-Low-Dose-Rate-Sensitivity (ELDRS) in Bipolar Junction Transistors",
abstract = "Data on bipolar junction transistors (BJTs) acquired from an in-flight mission experiment are recorded and downloaded for analysis. These data are analyzed for the purpose of characterizing the effects of low dose rate space irradiation on BJTs using a simulated PNP model that has been shown to accurately represent real-life effects of temperature on base current degradation. Results are compared to ground-based tests and show similar trends to LDR ground-based tests. These results will be used for validating recommended hardness assurance test methods for Enhanced-Low-Dose-Rate-Sensitivity (ELDRS) in the space environments and to gain insight into ELDRS mechanisms and the effects of the complex real space environment on BJTs.",
author = "Benedetto, {A. R.} and Barnaby, {H. J.} and Cheyenne Cook and Campola, {Michael J.} and Anna Tender",
note = "Funding Information: ACKNOWLEDGMENTS This material is based upon work supported by NASA on the program Living With a Star Space Environment Testbed Data Analysis for the ELDRS experiment. The authors thank Dr. Michael Xapsos for his continued support of this work and to all the NASA, Air Force, and SPACEX personnel who made this mission possible. The authors would also like to acknowledge the support of the following organizations: The Defense Threat Reduction Agency, Sandia National Laboratories, NAVSEA Crane, RLP Research, Vanderbilt University, and National Semiconductor Corporation. Publisher Copyright: {\textcopyright} 2022 IEEE.; 2022 IEEE Aerospace Conference, AERO 2022 ; Conference date: 05-03-2022 Through 12-03-2022",
year = "2022",
doi = "10.1109/AERO53065.2022.9843335",
language = "English (US)",
series = "IEEE Aerospace Conference Proceedings",
publisher = "IEEE Computer Society",
booktitle = "2022 IEEE Aerospace Conference, AERO 2022",
}